adspace
Explain about stuck at fault models, scan design, BIST and
IDDQ testing?
Answer Posted / seetharamukg
IDDQ testing is used for testing the library cells. Meaning
if any faults are there in our design we are going for DFT.
If any faults are there in the library itself we are doing
IDDQ testing.
| Is This Answer Correct ? | 3 Yes | 9 No |
Post New Answer View All Answers
Write a VLSI program that implements a toll booth controller?
Process technology? What package was used and how did you model the package/system? What parasitic effects were considered?
What work have you done on full chip Clock and Power distribution? What process technology and budgets were used?
What types of CMOS memories have you designed? What were their size? Speed?